Soft errors occur when high-energy charged particles alter the stored charge in a memory cell in an electronic circuit. The phenomenon first became an issue in DRAM, requiring error detection and correction for large memory systems in high-reliability applications. As device geometries have continued to shrink, the probability of soft errors in SRAM is becoming significant for some systems. Designers are using a variety of approaches to minimize the effects of soft errors on system behavior.
SRAM-based FPGAs store logic configuration data in SRAM cells. As the number and density of SRAM cells in an FPGA increase, the probability that a soft error will alter the programmed logical behavior of the system increases.
The Soft Error Detection is a user-configurable IP core, which allows the configuration of the IP and generation of a netlist and simulation file for use in designs. Please note that generating a bitstream may be prevented or the bitstream may have time logic present unless a license for the IP is purchased.
- 100% detection of single-bit errors
- 100% detection of two-bit errors within 10 adjacent frames
- 100% detection of multiple-bit errors within a 17-bit span
- (1-2-17)*100% detection of random multiple-bit errors
Block Diagram of the Soft Error Detection