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High Speed Access & Test IP USB Version
High speed access for test and in-chip sensor & monitor data throughout the silicon lifecycle. Within the SiliconMAX Platform, High-Speed Access & Test (HSAT) IP plays a critical role enabling high-speed interfaces such as USB, typically already present in SoCs, to be re-used for high-bandwidth production test. Further, this opens up the possibility to reuse the same high speed test packets and to repeat manufacturing tests in-system or in-field, providing visibility of functional or performance degradation during the device’s lifetime. Manufacturing tests can be repeated in-system and/or in-field.
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High Speed Access & Test IP
- High Speed Access & Test IP PCIE Version
- Silicon-proven, High Density and Low Power Static Random Access Memories
- Single Port SRAM compiler - Memory optimized for high density and speed - Dual Voltage - Compiler range up to 640 kbits
- High Performance 8051 Compatible CPU Core
- Interlaken, 40G, 8 Lanes
- Clock Delay Monitor IP