High Speed Access & Test IP PCIE Version

High speed access for test and in-chip sensor & monitor data throughout the silicon lifecycle. Within the SiliconMAX Platform, High-Speed Access & Test (HSAT) IP plays a critical role enabling high-speed interfaces such as PCIe, typically already present in SoCs, to be re-used for high-bandwidth production test. Further, this opens up the possibility to reuse the same high speed test packets and to repeat manufacturing tests in-system or in-field, providing visibility of functional or performance degradation during the device’s lifetime. Manufacturing tests can be repeated in-system and/or in-field.

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