The IEEE 1149.7 Compact TAP from Silvaco provides an IEEE 1149.7-compliant Test Access Port (TAP), enabling you to take advantage of IEEE 1149.7 features such as:
- 2-pin access to your on-chip IEEE 1149.1 test infrastructure
- Reduced scan times through shorter scan paths
- Efficient use of the 2-pin interface for both test and debug
The IEEE 1149.7 Compact TAP supports all mandatory and optional features of IEEE Std. 1149.7-2009 and is the cornerstone of the emerging Compact JTAG ecosystem—implemented in chips from Texas Instruments and other major semiconductor manufacturers and the reference design used by leading development system providers.